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Title: Determination of Stresses in Incrementally Deposited Films From Wafer-Curvature Measurements
Abstract We report closed-form formulas to calculate the incremental-deposition stress, the elastic relaxation stress, and the residual stress in a finite-thickness film from a wafer-curvature measurement. The calculation shows how the incremental deposition of a new stressed layer to the film affects the amount of the film/wafer curvature and the stress state of the previously deposited layers. The formulas allow the incremental-deposition stress and the elastic relaxation to be correctly calculated from the slope of the measured curvature versus thickness for arbitrary thicknesses and biaxial moduli of the film and the substrate. Subtraction of the cumulative elastic relaxation from the incremental-deposition stress history results in the residual stress left in the film after the whole deposition process. The validities of the formulas are confirmed by curvature measurements of electrodeposited Ni films on substrates with different thicknesses.  more » « less
Award ID(s):
1934314
PAR ID:
10189549
Author(s) / Creator(s):
; ; ; ;
Date Published:
Journal Name:
Journal of Applied Mechanics
Volume:
87
Issue:
10
ISSN:
0021-8936
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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