Nili, Hussein, Vincent, Adrien F., Prezesio, Mirko, Mahmoodi, Mohammad R., Kataeva, Irina, and Strukov, Dmitri B. Comprehensive Compact Phenomenological Modeling of Integrated Metal-Oxide Memristors. Retrieved from https://par.nsf.gov/biblio/10192392. IEEE Transactions on Nanotechnology 19. Web. doi:10.1109/TNANO.2020.2982128.

Nili, Hussein, Vincent, Adrien F., Prezesio, Mirko, Mahmoodi, Mohammad R., Kataeva, Irina, & Strukov, Dmitri B. Comprehensive Compact Phenomenological Modeling of Integrated Metal-Oxide Memristors. IEEE Transactions on Nanotechnology, 19 (). Retrieved from https://par.nsf.gov/biblio/10192392. https://doi.org/10.1109/TNANO.2020.2982128

Nili, Hussein, Vincent, Adrien F., Prezesio, Mirko, Mahmoodi, Mohammad R., Kataeva, Irina, and Strukov, Dmitri B. "Comprehensive Compact Phenomenological Modeling of Integrated Metal-Oxide Memristors". IEEE Transactions on Nanotechnology 19 (). Country unknown/Code not available. https://doi.org/10.1109/TNANO.2020.2982128. https://par.nsf.gov/biblio/10192392.

@article{osti_10192392,
place = {Country unknown/Code not available}, title = {Comprehensive Compact Phenomenological Modeling of Integrated Metal-Oxide Memristors}, url = {https://par.nsf.gov/biblio/10192392}, DOI = {10.1109/TNANO.2020.2982128}, abstractNote = {}, journal = {IEEE Transactions on Nanotechnology}, volume = {19}, author = {Nili, Hussein and Vincent, Adrien F. and Prezesio, Mirko and Mahmoodi, Mohammad R. and Kataeva, Irina and Strukov, Dmitri B.}, }