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Logic locking has emerged as a promising solution to protect integrated circuits against piracy and tampering. However, the security provided by existing logic locking techniques is often thwarted by Boolean satisfiability (SAT)-based oracle-guided attacks. Criteria for successful SAT attacks on locked circuits include: (i) the circuit under attack is fully combinational, or (ii) the attacker has scan chain access. To address the threat posed by SAT-based attacks, we adopt the dynamically obfuscated scan chain (DOSC) architecture and illustrate its resiliency against the SAT attacks when inserted into the scan chain of an obfuscated design. We demonstrate, both mathematically and experimentally, that DOSC exponentially increases the resiliency against key extraction by SAT attack and its variants. Our results show that the mathematical estimation of attack complexity correlates to the experimental results with an accuracy of 95% or better. Along with the formal proof, we model DOSC architecture to its equivalent combinational circuit and perform SAT attack to evaluate its resiliency empirically. Our experiments demonstrate that SAT attack on DOSC-inserted benchmark circuits timeout at minimal test time overhead, and while DOSC requires less than 1% area and power overhead.
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On Designing Secure and Robust Scan Chain for Protecting Obfuscated Logic
In this paper, we assess the security and testability of the state-of-the-art design-for-security (DFS) architectures in the presence of scan-chain locking/obfuscation, a group of solution that has previously proposed to restrict unauthorized access to the scan chain. We discuss the key leakage vulnerability in the recently published prior-art DFS architectures. This leakage relies on the potential glitches in the DFS architecture that could lead the adversary to make a leakage condition in the circuit. Also, we demonstrate that the state-of-the-art DFS architectures impose some substantial architectural drawbacks that moderately affect both test flow and design constraints. We propose a new DFS architecture for building a secure scan chain architecture while addressing the potential of key leakage. The proposed architecture allows the designer to perform the structural test with no limitation, enabling an untrusted foundry to utilize the scan chain for manufacturing fault testing without having a need to access the scan chain. Our proposed solution poses negligible limitation/overhead on the test flow, as well as the design criteria.
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- PAR ID:
- 10197817
- Date Published:
- Journal Name:
- GLSVLSI '20: Proceedings of the 2020 on Great Lakes Symposium on VLSI
- Page Range / eLocation ID:
- 217 to 222
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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- Free Publicly Accessible Full Text
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Accepted Manuscript1.0
- Conference Paper:
- https://doi.org/10.1145/3386263.3407655
