In this study, a conjugate radiation/conduction multimode heat transfer analysis of cryogenic focused ion beam (FIB) milling steps necessary for producing ex situ lift out specimens under cryogenic conditions (cryo-EXLO) is performed. Using finite volume for transient heat conduction and enclosure theory for radiation heat transfer, the analysis shows that as long as the specimen is attached or touching the FIB side wall trenches, the specimen will remain vitreous indefinitely, while actively cooled at liquid nitrogen (LN2) temperatures. To simulate the time needed to perform a transfer step to move the bulk sample containing the FIB-thinned specimen from the cryo-FIB to the cryo-EXLO cryostat, the LN2 temperature active cooling is turned off after steady-state conditions are reached and the specimen is monitored over time until the critical devitrification temperature is reached. Under these conditions, the sample will remain vitreous for >3 min, which is more than enough time needed to perform the cryo-transfer step from the FIB to the cryostat, which takes only ∼10 s. Cryo-transmission electron microscopy images of a manipulated cryo-EXLO yeast specimen prepared with cryo-FIB corroborates the heat transfer analysis.
Cryogenic transmission electron microscopy for materials research
Cryogenic transmission electron microscopy is simply transmission electron microscopy conducted on specimens that are cooled in the microscope. The target temperature of the specimen might range from just below ambient temperature to less than 4 K. In general, as the temperature decreases, cost increases, especially below –77°C when liquid He is required. We have two reasons for wanting to cool the specimen—improving stability of the material or observing a material whose properties change at lower temperatures. Both types of study have a long history. The cause of excitement in this field today is that we have a perfect storm of research activity—electron microscopes are almost stable with minimal drift (we can correct what drift there is), we can prepare specimens from the bulk or build them up, we have spherical-aberration-corrected lenses and monochromated beams, we have direct-electron-detector cameras, and computers are becoming powerful enough to handle all the data we produce.
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- NSF-PAR ID:
- 10197961
- Date Published:
- Journal Name:
- MRS Bulletin
- Volume:
- 44
- Issue:
- 12
- ISSN:
- 0883-7694
- Page Range / eLocation ID:
- 924 to 928
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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Abstract This work describes cryogenic ex situ lift out (cryo-EXLO) of cryogenic focused ion beam (cryo-FIB) thinned specimens for analysis by cryogenic transmission electron microscopy (cryo-TEM). The steps and apparatus necessary for cryo-EXLO are described. Methods designed to limit ice contamination include use of an anti-frost lid, a vacuum transfer assembly, and a cryostat. Cryo-EXLO is performed in a cryostat with the cryo-shuttle holder positioned in the cryogenic vapor phase above the surface of liquid N2 (LN2) using an EXLO manipulation station installed inside a glove box maintained at < 10% relative humidity and inert (e.g., N2 gas) conditions. Thermal modeling shows that a cryo-EXLO specimen will remain vitreous within its FIB trench indefinitely while LN2 is continuously supplied. Once the LN2 is cut off, modeling shows that the EXLO specimen will remain vitreous for over 4 min, allowing sufficient time for the cryo-transfer steps which take only seconds to perform. Cryo-EXLO was applied successfully to cryo-FIB-milled specimen preparation of a polymer sample and plunge-frozen yeast cells. Cryo-TEM of both the polymer and the yeast shows minimal ice contamination with the yeast specimen maintaining its vitreous phase, illustrating the potential of cryo-EXLO for cryo-FIB-TEM of beam-sensitive, liquid, or biological materials.more » « less
- Free Publicly Accessible Full Text
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Accepted Manuscript1.0
- Journal Article:
- https://doi.org/10.1557/mrs.2019.283
