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Title: Defect identification and statistics toolbox: automated defect analysis for scanning probe microscopy images
Award ID(s):
1709029
NSF-PAR ID:
10200366
Author(s) / Creator(s):
; ;
Date Published:
Journal Name:
Journal of Physics: Condensed Matter
Volume:
33
Issue:
4
ISSN:
0953-8984
Page Range / eLocation ID:
045901
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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