Wheat stripe rust (WSR), a fungal disease capable of inflicting severe crop loss, threatens most of global wheat production. Breeding for genetic resistance is the primary defense against stripe rust infection. Further development of rust-resistant wheat varieties depends on the ability to accurately and rapidly quantify rust resilience. In this study we demonstrate the ability of visible through shortwave infrared reflectance spectroscopy to effectively provide high-throughput classification of wheat stripe rust severity and identify important spectral regions for classification accuracy. Random forest models were developed using both leaf-level and canopy-level hyperspectral reflectance observations collected across a breeding population that was scored for WSR severity using 10 and 5 severity classes, respectively. The models were able to accurately diagnose scored disease severity class across these fine scoring scales between 45-52% of the time, which improved to 79-96% accuracy when allowing scores to be off-by-one. The canopy-level model demonstrated higher accuracy and distinct spectral characteristics relative to the leaf-level models, pointing to the use of this technology for field-scale monitoring. Leaf-level model performance was strong despite clear variation in scoring conducted between wheat growth stages. Two approaches to reduce predictor and model complexity, principal component dimensionality reduction and backward feature elimination, were applied here. Both approaches demonstrated that model classification skill could remain high while simplifying high-dimensional hyperspectral reflectance predictors, with parsimonious models having approximately 10 unique components or wavebands. Through the use of a high-resolution infection severity scoring methodology this study provides one of the most rigorous tests of the use of hyperspectral reflectance observations for WSR classification. We demonstrate that machine learning in combination with a few carefully-selected wavebands can be leveraged for precision remote monitoring and management of WSR to limit crop damage and to aid in the selection of resilient germplasm in breeding programs.
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Using Hyperspectral Imagery to Detect an Invasive Fungal Pathogen and Symptom Severity in Pinus strobiformis Seedlings of Different Genotypes
Finding trees that are resistant to pathogens is key in preparing for current and future disease threats such as the invasive white pine blister rust. In this study, we analyzed the potential of using hyperspectral imaging to find and diagnose the degree of infection of the non-native white pine blister rust in southwestern white pine seedlings from different seed-source families. A support vector machine was able to automatically detect infection with a classification accuracy of 87% (κ = 0.75) over 16 image collection dates. Hyperspectral imaging only missed 4% of infected seedlings that were impacted in terms of vigor according to expert’s assessments. Classification accuracy per family was highly correlated with mortality rate within a family. Moreover, classifying seedlings into a ‘growth vigor’ grouping used to identify the degree of impact of the disease was possible with 79.7% (κ = 0.69) accuracy. We ranked hyperspectral features for their importance in both classification tasks using the following features: 84 vegetation indices, simple ratios, normalized difference indices, and first derivatives. The most informative features were identified using a ‘new search algorithm’ that combines both the p-value of a 2-sample t-test and the Bhattacharyya distance. We ranked the normalized photochemical reflectance index (PRIn) first for infection detection. This index also had the highest classification accuracy (83.6%). Indices such as PRIn use only a small subset of the reflectance bands. This could be used for future developments of less expensive and more data-parsimonious multispectral cameras.
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- Award ID(s):
- 1832170
- PAR ID:
- 10214588
- Date Published:
- Journal Name:
- Remote Sensing
- Volume:
- 12
- Issue:
- 24
- ISSN:
- 2072-4292
- Page Range / eLocation ID:
- 4041
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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