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Title: Exploiting In-Memory Data Patterns for Performance Improvement on Crossbar Resistive Memory
Authors:
; ; ;
Award ID(s):
1910413 1725657 1718080
Publication Date:
NSF-PAR ID:
10217070
Journal Name:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Volume:
39
Issue:
10
Page Range or eLocation-ID:
2347 to 2360
ISSN:
0278-0070
Sponsoring Org:
National Science Foundation
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