Cui, Chunfeng, Liu, Kaikai, and Zhang, Zheng. Chance-Constrained and Yield-Aware Optimization of Photonic ICs With Non-Gaussian Correlated Process Variations. Retrieved from https://par.nsf.gov/biblio/10219422. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 39.12 Web. doi:10.1109/TCAD.2020.2968582.

Cui, Chunfeng, Liu, Kaikai, & Zhang, Zheng. Chance-Constrained and Yield-Aware Optimization of Photonic ICs With Non-Gaussian Correlated Process Variations. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 39 (12). Retrieved from https://par.nsf.gov/biblio/10219422. https://doi.org/10.1109/TCAD.2020.2968582

Cui, Chunfeng, Liu, Kaikai, and Zhang, Zheng. "Chance-Constrained and Yield-Aware Optimization of Photonic ICs With Non-Gaussian Correlated Process Variations". IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 39 (12). Country unknown/Code not available. https://doi.org/10.1109/TCAD.2020.2968582. https://par.nsf.gov/biblio/10219422.

@article{osti_10219422,
place = {Country unknown/Code not available}, title = {Chance-Constrained and Yield-Aware Optimization of Photonic ICs With Non-Gaussian Correlated Process Variations}, url = {https://par.nsf.gov/biblio/10219422}, DOI = {10.1109/TCAD.2020.2968582}, abstractNote = {}, journal = {IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems}, volume = {39}, number = {12}, author = {Cui, Chunfeng and Liu, Kaikai and Zhang, Zheng}, editor = {null} }