Allen, Troy R., Huang, Wenkang, Tanner, Jack R., Tan, Wenda, Fraser, James M., and Simonds, Brian J. Energy-Coupling Mechanisms Revealed through Simultaneous Keyhole Depth and Absorptance Measurements during Laser-Metal Processing. Retrieved from https://par.nsf.gov/biblio/10219951. Physical Review Applied 13.6 Web. doi:10.1103/PhysRevApplied.13.064070.

Allen, Troy R., Huang, Wenkang, Tanner, Jack R., Tan, Wenda, Fraser, James M., & Simonds, Brian J. Energy-Coupling Mechanisms Revealed through Simultaneous Keyhole Depth and Absorptance Measurements during Laser-Metal Processing. Physical Review Applied, 13 (6). Retrieved from https://par.nsf.gov/biblio/10219951. https://doi.org/10.1103/PhysRevApplied.13.064070

Allen, Troy R., Huang, Wenkang, Tanner, Jack R., Tan, Wenda, Fraser, James M., and Simonds, Brian J. "Energy-Coupling Mechanisms Revealed through Simultaneous Keyhole Depth and Absorptance Measurements during Laser-Metal Processing". Physical Review Applied 13 (6). Country unknown/Code not available. https://doi.org/10.1103/PhysRevApplied.13.064070. https://par.nsf.gov/biblio/10219951.

@article{osti_10219951,
place = {Country unknown/Code not available}, title = {Energy-Coupling Mechanisms Revealed through Simultaneous Keyhole Depth and Absorptance Measurements during Laser-Metal Processing}, url = {https://par.nsf.gov/biblio/10219951}, DOI = {10.1103/PhysRevApplied.13.064070}, abstractNote = {}, journal = {Physical Review Applied}, volume = {13}, number = {6}, author = {Allen, Troy R. and Huang, Wenkang and Tanner, Jack R. and Tan, Wenda and Fraser, James M. and Simonds, Brian J.}, editor = {null} }