We propose a new setting for testing properties of distributions while receiving samples from several distributions, but few samples per distribution. Given samples from s distributions, p_1, p_2, …, p_s, we design testers for the following problems: (1) Uniformity Testing: Testing whether all the p_i’s are uniform or ε-far from being uniform in ℓ_1-distance (2) Identity Testing: Testing whether all the p_i’s are equal to an explicitly given distribution q or ε-far from q in ℓ_1-distance, and (3) Closeness Testing: Testing whether all the p_i’s are equal to a distribution q which we have sample access to, or ε-far from q in ℓ_1-distance. By assuming an additional natural condition about the source distributions, we provide sample optimal testers for all of these problems.
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Testing Properties of Multiple Distributions with Few Samples.
We propose a new setting for testing properties of distributions while receiving samples from several distributions, but few samples per distribution. Given samples from s distributions, p_1, p_2, …, p_s, we design testers for the following problems: (1) Uniformity Testing: Testing whether all the p_i’s are uniform or ε-far from being uniform in ℓ_1-distance (2) Identity Testing: Testing whether all the p_i’s are equal to an explicitly given distribution q or ε-far from q in ℓ_1-distance, and (3) Closeness Testing: Testing whether all the p_i’s are equal to a distribution q which we have sample access to, or ε-far from q in ℓ_1-distance. By assuming an additional natural condition about the source distributions, we provide sample optimal testers for all of these problems.
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- Award ID(s):
- 1741137
- NSF-PAR ID:
- 10220369
- Date Published:
- Journal Name:
- 11th Innovations in Theoretical Computer Science Conference, ITCS 2020
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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