Deb, Pratiti, Cao, Michael C., Han, Yimo, Holtz, Megan E., Xie, Saien, Park, Jiwoong, Hovden, Robert, and Muller, David A. Imaging Polarity in Two Dimensional Materials by Breaking Friedel's Law. Retrieved from https://par.nsf.gov/biblio/10227964. Ultramicroscopy 215.C Web. doi:10.1016/j.ultramic.2020.113019.

Deb, Pratiti, Cao, Michael C., Han, Yimo, Holtz, Megan E., Xie, Saien, Park, Jiwoong, Hovden, Robert, & Muller, David A. Imaging Polarity in Two Dimensional Materials by Breaking Friedel's Law. Ultramicroscopy, 215 (C). Retrieved from https://par.nsf.gov/biblio/10227964. https://doi.org/10.1016/j.ultramic.2020.113019

Deb, Pratiti, Cao, Michael C., Han, Yimo, Holtz, Megan E., Xie, Saien, Park, Jiwoong, Hovden, Robert, and Muller, David A. "Imaging Polarity in Two Dimensional Materials by Breaking Friedel's Law". Ultramicroscopy 215 (C). Country unknown/Code not available. https://doi.org/10.1016/j.ultramic.2020.113019. https://par.nsf.gov/biblio/10227964.

@article{osti_10227964,
place = {Country unknown/Code not available}, title = {Imaging Polarity in Two Dimensional Materials by Breaking Friedel's Law}, url = {https://par.nsf.gov/biblio/10227964}, DOI = {10.1016/j.ultramic.2020.113019}, abstractNote = {}, journal = {Ultramicroscopy}, volume = {215}, number = {C}, author = {Deb, Pratiti and Cao, Michael C. and Han, Yimo and Holtz, Megan E. and Xie, Saien and Park, Jiwoong and Hovden, Robert and Muller, David A.}, editor = {null} }