Bachu, Saiphaneendra, Stanton, Lauren, Qian, Chenhao, Hickey, Danielle Reifsnyder, and Alem, Nasim. Comprehensive S/TEM Study of Interfaces in CVD Grown Vertical and In-plane Heterostructures of Two-Dimensional MoS2 and ReS2. Retrieved from https://par.nsf.gov/biblio/10231408. Microscopy and microanalysis 26.(Suppl 2) Web. doi:10.1017/S1431927620018826.

Bachu, Saiphaneendra, Stanton, Lauren, Qian, Chenhao, Hickey, Danielle Reifsnyder, & Alem, Nasim. Comprehensive S/TEM Study of Interfaces in CVD Grown Vertical and In-plane Heterostructures of Two-Dimensional MoS2 and ReS2. Microscopy and microanalysis, 26 ((Suppl 2)). Retrieved from https://par.nsf.gov/biblio/10231408. https://doi.org/10.1017/S1431927620018826

Bachu, Saiphaneendra, Stanton, Lauren, Qian, Chenhao, Hickey, Danielle Reifsnyder, and Alem, Nasim. "Comprehensive S/TEM Study of Interfaces in CVD Grown Vertical and In-plane Heterostructures of Two-Dimensional MoS2 and ReS2". Microscopy and microanalysis 26 ((Suppl 2)). Country unknown/Code not available. https://doi.org/10.1017/S1431927620018826. https://par.nsf.gov/biblio/10231408.

@article{osti_10231408,
place = {Country unknown/Code not available}, title = {Comprehensive S/TEM Study of Interfaces in CVD Grown Vertical and In-plane Heterostructures of Two-Dimensional MoS2 and ReS2}, url = {https://par.nsf.gov/biblio/10231408}, DOI = {10.1017/S1431927620018826}, abstractNote = {}, journal = {Microscopy and microanalysis}, volume = {26}, number = {(Suppl 2)}, author = {Bachu, Saiphaneendra and Stanton, Lauren and Qian, Chenhao and Hickey, Danielle Reifsnyder and Alem, Nasim}, editor = {null} }