Howlader, Chandan, Hasan, Mehedhi, Zakhidov, Alex, and Chen, Maggie Yihong. Determining the refractive index and the dielectric constant of PPDT2FBT thin film using spectroscopic ellipsometry. Retrieved from https://par.nsf.gov/biblio/10232223. Optical Materials 110.C Web. doi:10.1016/j.optmat.2020.110445.

Howlader, Chandan, Hasan, Mehedhi, Zakhidov, Alex, & Chen, Maggie Yihong. Determining the refractive index and the dielectric constant of PPDT2FBT thin film using spectroscopic ellipsometry. Optical Materials, 110 (C). Retrieved from https://par.nsf.gov/biblio/10232223. https://doi.org/10.1016/j.optmat.2020.110445

Howlader, Chandan, Hasan, Mehedhi, Zakhidov, Alex, and Chen, Maggie Yihong. "Determining the refractive index and the dielectric constant of PPDT2FBT thin film using spectroscopic ellipsometry". Optical Materials 110 (C). Country unknown/Code not available. https://doi.org/10.1016/j.optmat.2020.110445. https://par.nsf.gov/biblio/10232223.

@article{osti_10232223,
place = {Country unknown/Code not available}, title = {Determining the refractive index and the dielectric constant of PPDT2FBT thin film using spectroscopic ellipsometry}, url = {https://par.nsf.gov/biblio/10232223}, DOI = {10.1016/j.optmat.2020.110445}, abstractNote = {}, journal = {Optical Materials}, volume = {110}, number = {C}, author = {Howlader, Chandan and Hasan, Mehedhi and Zakhidov, Alex and Chen, Maggie Yihong}, editor = {null} }