Tuo, Rui, Wang, Yan, and Jeff Wu, C. F. On the Improved Rates of Convergence for Matérn-Type Kernel Ridge Regression with Application to Calibration of Computer Models. Retrieved from https://par.nsf.gov/biblio/10249648. SIAM/ASA Journal on Uncertainty Quantification 8.4 Web. doi:10.1137/19M1304222.

Tuo, Rui, Wang, Yan, & Jeff Wu, C. F. On the Improved Rates of Convergence for Matérn-Type Kernel Ridge Regression with Application to Calibration of Computer Models. SIAM/ASA Journal on Uncertainty Quantification, 8 (4). Retrieved from https://par.nsf.gov/biblio/10249648. https://doi.org/10.1137/19M1304222

Tuo, Rui, Wang, Yan, and Jeff Wu, C. F. "On the Improved Rates of Convergence for Matérn-Type Kernel Ridge Regression with Application to Calibration of Computer Models". SIAM/ASA Journal on Uncertainty Quantification 8 (4). Country unknown/Code not available. https://doi.org/10.1137/19M1304222. https://par.nsf.gov/biblio/10249648.

@article{osti_10249648,
place = {Country unknown/Code not available}, title = {On the Improved Rates of Convergence for Matérn-Type Kernel Ridge Regression with Application to Calibration of Computer Models}, url = {https://par.nsf.gov/biblio/10249648}, DOI = {10.1137/19M1304222}, abstractNote = {}, journal = {SIAM/ASA Journal on Uncertainty Quantification}, volume = {8}, number = {4}, author = {Tuo, Rui and Wang, Yan and Jeff Wu, C. F.}, editor = {null} }