Ren, Ivan, Zahiri, Feraidoon, Sutton, Gregory, Kurfess, Thomas, and Saldana, Christopher. A Deep Ensemble Classifier for Surface Defect Detection in Aircraft Visual Inspection. Retrieved from https://par.nsf.gov/biblio/10251528. Smart and Sustainable Manufacturing Systems 4.1 Web. doi:10.1520/SSMS20200031.

Ren, Ivan, Zahiri, Feraidoon, Sutton, Gregory, Kurfess, Thomas, & Saldana, Christopher. A Deep Ensemble Classifier for Surface Defect Detection in Aircraft Visual Inspection. Smart and Sustainable Manufacturing Systems, 4 (1). Retrieved from https://par.nsf.gov/biblio/10251528. https://doi.org/10.1520/SSMS20200031

Ren, Ivan, Zahiri, Feraidoon, Sutton, Gregory, Kurfess, Thomas, and Saldana, Christopher. "A Deep Ensemble Classifier for Surface Defect Detection in Aircraft Visual Inspection". Smart and Sustainable Manufacturing Systems 4 (1). Country unknown/Code not available. https://doi.org/10.1520/SSMS20200031. https://par.nsf.gov/biblio/10251528.

@article{osti_10251528,
place = {Country unknown/Code not available}, title = {A Deep Ensemble Classifier for Surface Defect Detection in Aircraft Visual Inspection}, url = {https://par.nsf.gov/biblio/10251528}, DOI = {10.1520/SSMS20200031}, abstractNote = {}, journal = {Smart and Sustainable Manufacturing Systems}, volume = {4}, number = {1}, author = {Ren, Ivan and Zahiri, Feraidoon and Sutton, Gregory and Kurfess, Thomas and Saldana, Christopher}, editor = {null} }