skip to main content


Title: Device Non-Ideality Effects and Architecture-Aware Training in RRAM In-Memory Computing Modules
Award ID(s):
1900675
NSF-PAR ID:
10273211
Author(s) / Creator(s):
; ;
Date Published:
Journal Name:
2021 IEEE International Symposium on Circuits and Systems (ISCAS)
Page Range / eLocation ID:
1 to 5
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
More Like this
No document suggestions found