The development of new optical materials and metamaterials has seen a natural progression toward both nanoscale geometries and dynamic performance. The development of these materials, such as optical metasurfaces which impart discrete, spatially dependent phase shifts on incident light, often benefits from the measurement of transmitted or reflected phase. Careful measurement of phase typically proves difficult to implement, due to high measurement sensitivity to practically unavoidable environmental sources of noise and drift. To date, no characterization technique has yet emerged as a frontrunner for these applications. This challenge is addressed using a custom‐designed three‐beam Mach–Zehnder interferometer capable of continuously referenced measurement of both phase and transmittance, resulting in a 10× reduction of noise and drift and phase measurement standard deviation over 10 min of 0.56° and over 16 h of 2.8°. High measurement stability provided by this method enables samples to be easily characterized under dynamic conditions. Temperature‐dependent measurements are demonstrated with phase‐change material vanadium dioxide (VO2), and with wavelength‐dependent measurements of a dielectric Huygens metasurface supporting a characteristic resonant reflection peak. A Fourier‐based signal filtering technique is applied, reducing measurement uncertainty to 0.13° and enabling discernment of monolayer thickness variations in 2D material MoS2.
The increasing prevalence of three-dimensional (3D) printing of optical housings and mounts necessitates a better understanding of the optical properties of printing materials. This paper describes a method for using multithickness samples of 3D printing materials to measure transmittance spectra at wavelengths from 400 to 2400 nm [visible to short-wave infrared (IR)]. In this method, 3D samples with material thicknesses of 1, 2, 3, and 4 mm were positioned in front of a uniform light source with a spectrometer probe on the opposing side to measure the light transmittance. Transmission depended primarily on the thickness and color of the sample, and multiple scattering prevented the use of a simple exponential model to relate transmittance, extinction, and thickness. A Solidworks file and a 3D printer file are included with the paper to enable measurements of additional materials with the same method.
more » « less- NSF-PAR ID:
- 10280531
- Publisher / Repository:
- Optical Society of America
- Date Published:
- Journal Name:
- Applied Optics
- Volume:
- 60
- Issue:
- 22
- ISSN:
- 1559-128X; APOPAI
- Page Range / eLocation ID:
- Article No. 6573
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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