Digital Defect Based Built-in Self-Test for Low Dropout Voltage Regulators

Ince, M.; Ozev, S.

doi:10.1109/ETS48528.2020.9131577

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Citation Details

Digital Defect Based Built-in Self-Test for Low Dropout Voltage Regulators

Award ID(s):: 1910380

PAR ID:: 10288014

Author(s) / Creator(s):: Ince, M.; Ozev, S.

Date Published:: 2020-09-16

Journal Name:: 2020 25th IEEE European Test Symposium (ETS)

Format(s):: Medium: X

Sponsoring Org:: National Science Foundation

Free Publicly Accessible Full Text
Accepted Manuscript1.0
Conference Paper:
https://doi.org/10.1109/ETS48528.2020.9131577

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