Digital Defect Based Built-in Self-Test for Low Dropout Voltage Regulators
- Award ID(s):
- 1910380
- NSF-PAR ID:
- 10288014
- Date Published:
- Journal Name:
- 2020 25th IEEE European Test Symposium (ETS)
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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- Free Publicly Accessible Full Text
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Accepted Manuscript1.0
- Conference Paper:
- https://doi.org/10.1109/ETS48528.2020.9131577
