skip to main content
US FlagAn official website of the United States government
dot gov icon
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
https lock icon
Secure .gov websites use HTTPS
A lock ( lock ) or https:// means you've safely connected to the .gov website. Share sensitive information only on official, secure websites.

Explore Research Products in the PAR
It may take a few hours for recently added research products to appear in PAR search results.


  • Home
  • Search Results
  • Page 1 of 1

Search for: All records

Award ID contains: 1910380

Note: When clicking on a Digital Object Identifier (DOI) number, you will be taken to an external site maintained by the publisher. Some full text articles may not yet be available without a charge during the embargo (administrative interval).
What is a DOI Number?

Some links on this page may take you to non-federal websites. Their policies may differ from this site.

  1. ; ; (, 2023 IEEE 41st VLSI Test Symposium (VTS))
    Full Text Available 
  2. ; ; ; (, Government Microcircuit Applications and Critical Technology Conference)
    Accepted Manuscript Full Text Available
  3. ; ; (, IEEE Nuclear and Space Radiation Effects Conference)
    Atmospheric neutrons can produce damaging effects in power management integrated circuits (PMICs). Three commercial PMICs have been irradiated with neutrons to investigate displacement damage effects in low drop-out (LDO) and stepdown (Buck) voltage regulators. 
    more » « less
    Accepted Manuscript Full Text Available
  4. ; ; ; (, . 2021 Government Microcircuit Applications and Critical Technologies Conference (GOMACTech))
    null (Ed.)
    Accepted Manuscript Full Text Available
  5. ; (, 2020 25th IEEE European Test Symposium (ETS))
    null (Ed.)
    Full Text Available