Chu, Zhigang, Zhang, Jiazi, Kosut, Oliver, and Sankar, Lalitha. $N-1$ Reliability Makes It Difficult for False Data Injection Attacks to Cause Physical Consequences. Retrieved from https://par.nsf.gov/biblio/10291079. IEEE Transactions on Power Systems 36.5 Web. doi:10.1109/TPWRS.2021.3061480.

Chu, Zhigang, Zhang, Jiazi, Kosut, Oliver, & Sankar, Lalitha. $N-1$ Reliability Makes It Difficult for False Data Injection Attacks to Cause Physical Consequences. IEEE Transactions on Power Systems, 36 (5). Retrieved from https://par.nsf.gov/biblio/10291079. https://doi.org/10.1109/TPWRS.2021.3061480

Chu, Zhigang, Zhang, Jiazi, Kosut, Oliver, and Sankar, Lalitha. "$N-1$ Reliability Makes It Difficult for False Data Injection Attacks to Cause Physical Consequences". IEEE Transactions on Power Systems 36 (5). Country unknown/Code not available. https://doi.org/10.1109/TPWRS.2021.3061480. https://par.nsf.gov/biblio/10291079.

@article{osti_10291079,
place = {Country unknown/Code not available}, title = {$N-1$ Reliability Makes It Difficult for False Data Injection Attacks to Cause Physical Consequences}, url = {https://par.nsf.gov/biblio/10291079}, DOI = {10.1109/TPWRS.2021.3061480}, abstractNote = {}, journal = {IEEE Transactions on Power Systems}, volume = {36}, number = {5}, author = {Chu, Zhigang and Zhang, Jiazi and Kosut, Oliver and Sankar, Lalitha}, editor = {null} }