Trapped fractional charges at bulk defects in topological insulators (Journal Article) | NSF PAGES

skip to main content

Citation Details

Trapped fractional charges at bulk defects in topological insulators

Award ID(s):: 1641084

NSF-PAR ID:: 10294418

Author(s) / Creator(s):: Peterson, Christopher W.; Li, Tianhe; Jiang, Wentao; Hughes, Taylor L.; Bahl, Gaurav

Date Published:: 2021-01-21

Journal Name:: Nature

Volume:: 589

Issue:: 7842

ISSN:: 0028-0836

Page Range / eLocation ID:: 376 to 380

Format(s):: Medium: X

Sponsoring Org:: National Science Foundation

Free Publicly Accessible Full Text
Accepted Manuscript1.0
Journal Article:
https://doi.org/10.1038/s41586-020-03117-3