Zhang, Nathan, Pu, Shi, and Akin, Bilal. An Automated Multi-Device Characterization System for Reliability Assessment of Power Semiconductors. Retrieved from https://par.nsf.gov/biblio/10308798. 2021 IEEE 13th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED) . Web. doi:10.1109/sdemped51010.2021.9605489.

Zhang, Nathan, Pu, Shi, & Akin, Bilal. An Automated Multi-Device Characterization System for Reliability Assessment of Power Semiconductors. 2021 IEEE 13th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED), (). Retrieved from https://par.nsf.gov/biblio/10308798. https://doi.org/10.1109/sdemped51010.2021.9605489

Zhang, Nathan, Pu, Shi, and Akin, Bilal. "An Automated Multi-Device Characterization System for Reliability Assessment of Power Semiconductors". 2021 IEEE 13th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED) (). Country unknown/Code not available. https://doi.org/10.1109/sdemped51010.2021.9605489. https://par.nsf.gov/biblio/10308798.

@article{osti_10308798,
place = {Country unknown/Code not available}, title = {An Automated Multi-Device Characterization System for Reliability Assessment of Power Semiconductors}, url = {https://par.nsf.gov/biblio/10308798}, DOI = {10.1109/sdemped51010.2021.9605489}, abstractNote = {}, journal = {2021 IEEE 13th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED)}, author = {Zhang, Nathan and Pu, Shi and Akin, Bilal}, }