We report on the illustration of the first electron blocking layer (EBL) free AlInN nanowire light-emitting diodes (LEDs) operating in the deep ultraviolet (DUV) wavelength region (sub-250 nm). We have systematically analyzed the results using APSYS software and compared with simulated AlGaN nanowire DUV LEDs. From the simulation results, significant efficiency droop was observed in AlGaN based devices, attributed to the significant electron leakage. However, compared to AlGaN nanowire DUV LEDs at similar emission wavelength, the proposed single quantum well (SQW) AlInN based light-emitters offer higher internal quantum efficiency without droop up to current density of 1500 A/cm2and high output optical power. Moreover, we find that transverse magnetic polarized emission is ∼ 5 orders stronger than transverse electric polarized emission at 238 nm wavelength. Further research shows that the performance of the AlInN DUV nanowire LEDs decreases with multiple QWs in the active region due to the presence of the non-uniform carrier distribution in the active region. This study provides important insights on the design of new type of high performance AlInN nanowire DUV LEDs, by replacing currently used AlGaN semiconductors.
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Controlled Electron Leakage in Electron Blocking Layer Free InGaN/GaN Nanowire Light-Emitting Diodes
In this study, we have proposed and investigated the effect of coupled quantum wells to reduce electron overflow in InGaN/GaN nanowire white color light-emitting diodes. The coupled quantum well before the active region could decrease the thermal velocity, which leads to a reduced electron mean free path. This improves the electron confinement in the active region and mitigates electron overflow in the devices. In addition, coupled quantum well after the active region utilizes the leaked electrons from the active region and contributes to the white light emission. Therefore, the output power and external quantum efficiency of the proposed nanowire LEDs are improved. Moreover, the efficiency droop was negligible up to 900 mA injection current.
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- Award ID(s):
- 2013780
- PAR ID:
- 10312316
- Date Published:
- Journal Name:
- Facta Universitatis
- Volume:
- 34
- Issue:
- 3
- ISSN:
- 0352-9665
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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