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Title: (Invited) How to Achieve Low Thermal Resistance and High Electrothermal Ruggedness in Ga 2 O 3 Devices?
Authors:
; ; ; ; ; ; ; ; ;
Award ID(s):
2100504
Publication Date:
NSF-PAR ID:
10312828
Journal Name:
ECS Transactions
Volume:
104
Issue:
5
ISSN:
1938-5862
Sponsoring Org:
National Science Foundation
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