Universal machine learning framework for defect predictions in zinc blende semiconductors
- Award ID(s):
- 1719797
- NSF-PAR ID:
- 10316757
- Date Published:
- Journal Name:
- Patterns
- ISSN:
- 2666-3899
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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Accepted Manuscript1.0
- Journal Article:
- https://doi.org/10.1016/j.patter.2022.100450
