Huang, Shuoyuan, Francis, Carter, Ketkaew, Jittisa, Schroers, Jan, and Voyles, Paul M. Correlation symmetry analysis of electron nanodiffraction from amorphous materials. Retrieved from https://par.nsf.gov/biblio/10318455. Ultramicroscopy 232.C Web. doi:10.1016/j.ultramic.2021.113405.
Huang, Shuoyuan, Francis, Carter, Ketkaew, Jittisa, Schroers, Jan, & Voyles, Paul M. Correlation symmetry analysis of electron nanodiffraction from amorphous materials. Ultramicroscopy, 232 (C). Retrieved from https://par.nsf.gov/biblio/10318455. https://doi.org/10.1016/j.ultramic.2021.113405
@article{osti_10318455,
place = {Country unknown/Code not available},
title = {Correlation symmetry analysis of electron nanodiffraction from amorphous materials},
url = {https://par.nsf.gov/biblio/10318455},
DOI = {10.1016/j.ultramic.2021.113405},
abstractNote = {},
journal = {Ultramicroscopy},
volume = {232},
number = {C},
author = {Huang, Shuoyuan and Francis, Carter and Ketkaew, Jittisa and Schroers, Jan and Voyles, Paul M.},
}
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