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1. Photoluminescence from defects in GaN

   https://doi.org/10.1117/12.2645878  

   Reshchikov, Michael A. (March 2023, Photoluminescence from defects in GaN)

   Morkoç, Hadis; Fujioka, Hiroshi; Schwarz, Ulrich T. (Ed.)

   We present the most recent results of photoluminescence (PL) studies, classification of defects in GaN and their properties. In particular, the yellow luminescence band (labeled YL1) with a maximum at 2.17 eV in undoped GaN grown by most common techniques is unambiguously attributed to the isolated CN acceptor. From the zero-phonon line (ZPL) at 2.59 eV, the /0 level of this acceptor is found at 0.916 eV above the valence band. The PL also reveals the 0/+ level of the CN at 0.33 eV above the valence band, which is responsible for the blue band (BLC), with the ZPL at 3.17 eV. Another yellow band (YL2) with a maximum at 2.3 eV, observed only in GaN grown by the ammonothermal method, is attributed to the VGa3H complex. The nitrogen vacancy (VN) causes the green luminescence (GL2) band. The VN also forms complexes with acceptors such as Mg, Be, and Ca. These complexes are responsible for the red luminescence bands (the RL2 family) in high-resistivity GaN. The results from PL studies are compared with theoretical predictions. Uncertainties in the parameters of defects are discussed. 

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2. Optical transitions of neutral Mg in Mg-doped β -Ga2O3

   https://doi.org/10.1063/5.0081925  

   Bhandari, Suman; Lyons, John_L; Wickramaratne, Darshana; Zvanut, M_E (February 2022, APL Materials)

   Gallium oxide when doped with Mg becomes semi-insulating and can be useful for power electronic devices. The present work investigates optical transitions of neutral Mg (MgGa0) using photoinduced electron paramagnetic resonance spectroscopy, a variation of the traditional optical absorption. Steady-state and time-dependent measurements are carried out at 130 K by illuminating the samples with photon energies from 0.7 to 4.4 eV. Interpretation of the data using a model that incorporates electron–phonon coupling yields a defect transition level that is consistent with the MgGa−/0 level obtained from hybrid density functional theory calculations. We conclude that the neutral to negative transition of MgGa that we observe involves an electron transition from the valence band to the defect, and the MgGa−/0 level is located 1.2 eV above the valence band maximum, with a relaxation energy of 1.3 eV. 

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3. Photoluminescence from Defects in Be‐Doped GaN

   https://doi.org/10.1002/pssb.202400656  

   Reshchikov, Michael_Alexander; McEwen, Benjamin; Shahedipour‐Sandvik, Shadi (February 2025, physica status solidi (b))

   While GaN is a crucial semiconductor material for bright light‐emitting devices, fabrication of p‐type GaN remains challenging since the Mg acceptor commonly used for p‐type doping is not shallow enough. Doping of GaN with Be is a promising path, yet no reliable p‐type GaN has been achieved by Be doping so far. One of the reasons is a poor understanding of point defects in Be‐doped GaN that can be studied by photoluminescence (PL). The yellow (YL_Be) band at 2.15 eV is the dominant PL band in Be‐doped GaN. In this work, a blue PL band named the BL_Beband is discovered. It has a maximum at 2.6 eV and a lifetime of 0.8 μs at temperatures below 100 K. The BL_Beband is observed in GaN samples with relatively high concentrations of Be (>10¹⁸ cm⁻³). Both the YL_Beand BL_Bebands likely originate from the isolated Be_Gadefect, namely from electron transitions via the −/0 and 0/+ thermodynamic transition levels of the Be_Ga. The 0/+ transition level is located at 0.1–0.2 eV above the valence band. Other broad PL bands in Be‐doped GaN were also observed and preliminarily attributed to Be‐containing complexes. 

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4. Stability of the C _N H _i Complex and the Blue Luminescence Band in GaN

   https://doi.org/10.1002/pssb.202100392  

   Reshchikov, Michael Alexander; Andrieiev, Oleksandr; Vorobiov, Mykhailo; McEwen, Ben; Shahedipour-Sandvik, Shadi; Ye, Dexian; Demchenko, Denis O. (October 2021, physica status solidi (b))

   The dissociation of the C_NH_icomplex in GaN is studied in detail using photoluminescence measurements and first‐principles calculations. The blue luminescence (BL2) band with a maximum at 3.0 eV is caused by electron transitions from an excited state located at 0.02 eV below the conduction band to the ground state of the C_NH_idonor with the 0/+ level 0.15 eV above the valence band. The dissociation releases hydrogen atom, and the remaining C_Ndefect with the −/0 state at 0.92 eV above the valence band is responsible for the yellow band (YL1) with a maximum at about 2.2 eV. The dissociation of the C_NH_icomplex can be caused by the photoinduced defect reaction mechanism under UV illumination at low temperature (≈20 K), leading to the bleaching of the BL2 band and simultaneous rise in the YL1 band. The bleaching is reversible. Alternatively, the complex dissociates after annealing at temperatures above 600 °C. The activation energy of this process (3–4 eV, depending on the annealing geometry) corresponds to the removal of hydrogen from the sample and not to the dissociation of the complex itself. 

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5. Identification of Defect Levels in Copper Indium Diselenide (CuInSe2) Thin Films via Photoluminescence Studies

   https://doi.org/10.1557/adv.2018.556  

   Niraj Shrestha, Dhurba R. (August 2018, MRS advances)

   Photoluminescence (PL) spectroscopy has been used to study the defect levels in thin film copper indium diselenide (CuInSe2, CIS) which we are developing as the absorber layer for the bottom cell of a monolithically grown perovskite/CuInSe2 tandem solar cell. Temperature and laser power dependent PL measurements of thin film CIS for two different Cu/In ratios (0.66 and 0.80) have been performed. The CIS film with Cu/In = 0.80 shows a prominent donor-to-acceptor peak (DAP) involving a shallow acceptor of binding energy ~22 meV, with phonon replica at ~32 meV spacing. In contrast, PL measurement of CIS film for Cu/In = 0.66 taken at 20 K exhibited an asymmetric and broad PL spectrum with peaks at 0.845 eV and 0.787 eV. Laser intensity dependent PL revealed that the observed peaks 0.845 eV and 0.787 eV shift towards higher energy (aka j-shift) at ~11.7 meV/decade and ~ 8 meV/decade with increase in laser intensity respectively. The asymmetric and broad spectrum together with large j-shift suggests that the observed peaks at 0.845 eV and 0.787 eV were related to band to-tail (BT) and band-to-impurity (BI) transition, respectively. Such a band-tail-related transition originates from the potential fluctuation of defect states at low temperature. The appearance of band related transition in CIS film with Cu/In = 0.66 is the indicator of the presence of large number of charged defect states. 

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