An official website of the United States government
While GaN is a crucial semiconductor material for bright light‐emitting devices, fabrication of p‐type GaN remains challenging since the Mg acceptor commonly used for p‐type doping is not shallow enough. Doping of GaN with Be is a promising path, yet no reliable p‐type GaN has been achieved by Be doping so far. One of the reasons is a poor understanding of point defects in Be‐doped GaN that can be studied by photoluminescence (PL). The yellow (YLBe) band at 2.15 eV is the dominant PL band in Be‐doped GaN. In this work, a blue PL band named the BLBeband is discovered. It has a maximum at 2.6 eV and a lifetime of 0.8 μs at temperatures below 100 K. The BLBeband is observed in GaN samples with relatively high concentrations of Be (>1018 cm−3). Both the YLBeand BLBebands likely originate from the isolated BeGadefect, namely from electron transitions via the −/0 and 0/+ thermodynamic transition levels of the BeGa. The 0/+ transition level is located at 0.1–0.2 eV above the valence band. Other broad PL bands in Be‐doped GaN were also observed and preliminarily attributed to Be‐containing complexes.
more »
« less
Identification of Defect Levels in Copper Indium Diselenide (CuInSe2) Thin Films via Photoluminescence Studies
Photoluminescence (PL) spectroscopy has been used to study the defect levels in thin film copper indium diselenide (CuInSe2, CIS) which we are developing as the absorber layer for the bottom cell of a monolithically grown perovskite/CuInSe2 tandem solar cell. Temperature and laser power dependent PL measurements of thin film CIS for two different Cu/In ratios (0.66 and 0.80) have been performed. The CIS film with Cu/In = 0.80 shows a prominent donor-to-acceptor peak (DAP) involving a shallow acceptor of binding energy ~22 meV, with phonon replica at ~32 meV spacing. In contrast, PL measurement of CIS film for Cu/In = 0.66 taken at 20 K exhibited an asymmetric and broad PL spectrum with peaks at 0.845 eV and 0.787 eV. Laser intensity dependent PL revealed that the observed peaks 0.845 eV and 0.787 eV shift towards higher energy (aka j-shift) at ~11.7 meV/decade and ~ 8 meV/decade with increase in laser intensity respectively. The asymmetric and broad spectrum together with large j-shift suggests that the observed peaks at 0.845 eV and 0.787 eV were related to band to-tail (BT) and band-to-impurity (BI) transition, respectively. Such a band-tail-related transition originates from the potential fluctuation of defect states at low temperature. The appearance of band related transition in CIS film with Cu/In = 0.66 is the indicator of the presence of large number of charged defect states.
more »
« less
- Award ID(s):
- 1665172
- PAR ID:
- 10170866
- Date Published:
- Journal Name:
- MRS advances
- Volume:
- 3
- Issue:
- 52
- ISSN:
- 2059-8521
- Page Range / eLocation ID:
- 3135-3141
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
More Like this
-
-
The enargite phase of Cu3AsS4 (ENG) is an emerging photovoltaic material with a ∼1.4 eV bandgap and is composed of earth abundant elements with favorable defect properties arising from the differing ionic radii of the constituent elements. Unfortunately, ENG-based photovoltaic devices have experimentally been shown to have low power conversion efficiencies, possibly due to defects in the material. In this joint computational and experimental study, we explore the defect properties of ENG and employ synthesis approaches, such as silver alloying, to reduce the density of harmful defects. We show that shallow copper vacancies (VCu) are expected to be the primary defects in ENG and contribute to its p-type character. However, as shown through photoluminescence (PL) measurements of synthesized ENG, a large mid-bandgap PL peak is present at ∼0.87 eV from a band edge, potentially caused by a copper- or sulfur-related defect. To improve the properties of ENG films and mitigate the mid-bandgap PL, we employed an amine-thiol molecular precursor-based synthesis approach and utilized silver alloying of ENG films. While silver alloying did not affect the mid-bandgap PL peak, it increased grain size and lowered film porosity, improving device performance. In conclusion, we found that incorporating silver such that [Ag]/([Ag] + [Cu]) is 0.05 in the film using an amine-thiol based molecular precursor route with As2S3 as the arsenic source resulted in improved photovoltaic device performance with a champion device of efficiency 0.60%, the highest reported efficiency for an Cu3AsS4 (ENG)-based device to date.more » « less
-
A series of atomic-like photoluminescence (PL) emission peaks in UV region near 4.0 eV were created by thermal annealing hexagonal boron nitride (h-BN) single crystals in air. The pristine h-BN did not have these peaks, emitting strong phonon-assisted band edge PL with peaks at 5.78 and 5.89 eV. After annealing the h-BN crystals in ambient air, a new atomic-like sharp emission in UV region at 4.09 eV with a line width of 0.2 nm appeared along with its phonon replicas at 3.89 and 3.69 eV in the low temperature (8 K) PL measurement. Further testing demonstrated that annealing the h-BN samples in the temperature window of 700–950 °C for 60 min generated the atomic-like emission. The peak position of the emission line is stable with the temperature and PL excitation power. Our study also suggests that the defect responsible for the atomic-like emission resides in the surface region.more » « less
-
A systematic photoluminescence study of Be‐doped GaN grown by metal‐organic chemical vapor deposition is presented. All Be‐doped samples show the ultraviolet luminescence (UVLBe) band with a maximum at 3.38 eV and the yellow luminescence (YLBe) band with a maximum at ≈2.15 eV in GaN:Be having various concentrations of Be. The UVLBeband is attributed to the shallow state of the BeGaacceptor with a delocalized hole. The YLBeband is caused by a Be‐related defect, possibly the polaronic state of the BeGaacceptor with the charge transition level at 0.3 eV above the valence band. This broad band exhibits unusual properties. In particular, it always shows two steps in its thermal quenching. The second step atT ≈ 200 K is attributed to the emission of holes from the 0.3 eV level to the conduction band. The origin of the first step remains unexplained.more » « less
-
Morkoç, Hadis; Fujioka, Hiroshi; Schwarz, Ulrich T. (Ed.)We present the most recent results of photoluminescence (PL) studies, classification of defects in GaN and their properties. In particular, the yellow luminescence band (labeled YL1) with a maximum at 2.17 eV in undoped GaN grown by most common techniques is unambiguously attributed to the isolated CN acceptor. From the zero-phonon line (ZPL) at 2.59 eV, the /0 level of this acceptor is found at 0.916 eV above the valence band. The PL also reveals the 0/+ level of the CN at 0.33 eV above the valence band, which is responsible for the blue band (BLC), with the ZPL at 3.17 eV. Another yellow band (YL2) with a maximum at 2.3 eV, observed only in GaN grown by the ammonothermal method, is attributed to the VGa3H complex. The nitrogen vacancy (VN) causes the green luminescence (GL2) band. The VN also forms complexes with acceptors such as Mg, Be, and Ca. These complexes are responsible for the red luminescence bands (the RL2 family) in high-resistivity GaN. The results from PL studies are compared with theoretical predictions. Uncertainties in the parameters of defects are discussed.more » « less
- Free Publicly Accessible Full Text
-
Accepted Manuscript1.0
- Journal Article:
- https://doi.org/10.1557/adv.2018.556
