While GaN is a crucial semiconductor material for bright light‐emitting devices, fabrication of p‐type GaN remains challenging since the Mg acceptor commonly used for p‐type doping is not shallow enough. Doping of GaN with Be is a promising path, yet no reliable p‐type GaN has been achieved by Be doping so far. One of the reasons is a poor understanding of point defects in Be‐doped GaN that can be studied by photoluminescence (PL). The yellow (YLBe) band at 2.15 eV is the dominant PL band in Be‐doped GaN. In this work, a blue PL band named the BLBeband is discovered. It has a maximum at 2.6 eV and a lifetime of 0.8 μs at temperatures below 100 K. The BLBeband is observed in GaN samples with relatively high concentrations of Be (>1018 cm−3). Both the YLBeand BLBebands likely originate from the isolated BeGadefect, namely from electron transitions via the −/0 and 0/+ thermodynamic transition levels of the BeGa. The 0/+ transition level is located at 0.1–0.2 eV above the valence band. Other broad PL bands in Be‐doped GaN were also observed and preliminarily attributed to Be‐containing complexes.
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Photoluminescence from defects in GaN
We present the most recent results of photoluminescence (PL) studies, classification of defects in GaN and their properties. In particular, the yellow luminescence band (labeled YL1) with a maximum at 2.17 eV in undoped GaN grown by most common techniques is unambiguously attributed to the isolated CN acceptor. From the zero-phonon line (ZPL) at 2.59 eV, the /0 level of this acceptor is found at 0.916 eV above the valence band. The PL also reveals the 0/+ level of the CN at 0.33 eV above the valence band, which is responsible for the blue band (BLC), with the ZPL at 3.17 eV. Another yellow band (YL2) with a maximum at 2.3 eV, observed only in GaN grown by the ammonothermal method, is attributed to the VGa3H complex. The nitrogen vacancy (VN) causes the green luminescence (GL2) band. The VN also forms complexes with acceptors such as Mg, Be, and Ca. These complexes are responsible for the red luminescence bands (the RL2 family) in high-resistivity GaN. The results from PL studies are compared with theoretical predictions. Uncertainties in the parameters of defects are discussed.
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- Award ID(s):
- 1904861
- PAR ID:
- 10429922
- Editor(s):
- Morkoç, Hadis; Fujioka, Hiroshi; Schwarz, Ulrich T.
- Date Published:
- Journal Name:
- Photoluminescence from defects in GaN
- Volume:
- 1242109
- Page Range / eLocation ID:
- 17
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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