Tang, Chunli, Alahmed, Laith, Xu, Jihao, Shen, Maokang, Jones, Nicholas Alex, Sadi, Mehdi, Guin, Ujjwal, Zhao, Wenfeng, and Li, Peng. Effects of Temperature and Structural Geometries on a Skyrmion Logic Gate. Retrieved from https://par.nsf.gov/biblio/10323994. IEEE Transactions on Electron Devices 69.4 Web. doi:10.1109/TED.2021.3130217.

Tang, Chunli, Alahmed, Laith, Xu, Jihao, Shen, Maokang, Jones, Nicholas Alex, Sadi, Mehdi, Guin, Ujjwal, Zhao, Wenfeng, & Li, Peng. Effects of Temperature and Structural Geometries on a Skyrmion Logic Gate. IEEE Transactions on Electron Devices, 69 (4). Retrieved from https://par.nsf.gov/biblio/10323994. https://doi.org/10.1109/TED.2021.3130217

Tang, Chunli, Alahmed, Laith, Xu, Jihao, Shen, Maokang, Jones, Nicholas Alex, Sadi, Mehdi, Guin, Ujjwal, Zhao, Wenfeng, and Li, Peng. "Effects of Temperature and Structural Geometries on a Skyrmion Logic Gate". IEEE Transactions on Electron Devices 69 (4). Country unknown/Code not available. https://doi.org/10.1109/TED.2021.3130217. https://par.nsf.gov/biblio/10323994.

@article{osti_10323994,
place = {Country unknown/Code not available}, title = {Effects of Temperature and Structural Geometries on a Skyrmion Logic Gate}, url = {https://par.nsf.gov/biblio/10323994}, DOI = {10.1109/TED.2021.3130217}, abstractNote = {}, journal = {IEEE Transactions on Electron Devices}, volume = {69}, number = {4}, author = {Tang, Chunli and Alahmed, Laith and Xu, Jihao and Shen, Maokang and Jones, Nicholas Alex and Sadi, Mehdi and Guin, Ujjwal and Zhao, Wenfeng and Li, Peng}, }