Rapid MOSFET Contact Resistance Extraction From Circuit Using SPICE-Augmented Machine Learning Without Feature Extraction
- Award ID(s):
- 2046220
- PAR ID:
- 10324330
- Date Published:
- Journal Name:
- IEEE Transactions on Electron Devices
- Volume:
- 68
- Issue:
- 12
- ISSN:
- 0018-9383
- Page Range / eLocation ID:
- 6026 to 6032
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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