Chen, Zhen, Jiang, Yi, Shao, Yu-Tsun, Holtz, Megan, Odstrcil, Michal, Guizar-Sicairos, Manuel, Hanke, Isabelle, Ganschow, Steffen, Schlom, Darrell, and Muller, David. Multislice electron ptychography enables lattice vibration-limited resolution and linear phase-contrast imaging in thick samples. Retrieved from https://par.nsf.gov/biblio/10325451. Microscopy and Microanalysis 27.S1 Web. doi:10.1017/S1431927621003020.

Chen, Zhen, Jiang, Yi, Shao, Yu-Tsun, Holtz, Megan, Odstrcil, Michal, Guizar-Sicairos, Manuel, Hanke, Isabelle, Ganschow, Steffen, Schlom, Darrell, & Muller, David. Multislice electron ptychography enables lattice vibration-limited resolution and linear phase-contrast imaging in thick samples. Microscopy and Microanalysis, 27 (S1). Retrieved from https://par.nsf.gov/biblio/10325451. https://doi.org/10.1017/S1431927621003020

Chen, Zhen, Jiang, Yi, Shao, Yu-Tsun, Holtz, Megan, Odstrcil, Michal, Guizar-Sicairos, Manuel, Hanke, Isabelle, Ganschow, Steffen, Schlom, Darrell, and Muller, David. "Multislice electron ptychography enables lattice vibration-limited resolution and linear phase-contrast imaging in thick samples". Microscopy and Microanalysis 27 (S1). Country unknown/Code not available. https://doi.org/10.1017/S1431927621003020. https://par.nsf.gov/biblio/10325451.

@article{osti_10325451,
place = {Country unknown/Code not available}, title = {Multislice electron ptychography enables lattice vibration-limited resolution and linear phase-contrast imaging in thick samples}, url = {https://par.nsf.gov/biblio/10325451}, DOI = {10.1017/S1431927621003020}, abstractNote = {}, journal = {Microscopy and Microanalysis}, volume = {27}, number = {S1}, author = {Chen, Zhen and Jiang, Yi and Shao, Yu-Tsun and Holtz, Megan and Odstrcil, Michal and Guizar-Sicairos, Manuel and Hanke, Isabelle and Ganschow, Steffen and Schlom, Darrell and Muller, David}, }