Schnitzer, Noah, Goodge, Berit, Bianco, Elisabeth, Admasu, Alemayehu, Kim, Jaewook, Cheong, Sang-Wook, Baggari, Ismail El, and Kourkoutis, Lena. Tracking motion of topological defects in a stripe charge-ordered phase with continuously variable temperature cryo-STEM. Retrieved from https://par.nsf.gov/biblio/10325670. Microscopy and Microanalysis 27.S1 Web. doi:10.1017/S143192762100355X.

Schnitzer, Noah, Goodge, Berit, Bianco, Elisabeth, Admasu, Alemayehu, Kim, Jaewook, Cheong, Sang-Wook, Baggari, Ismail El, & Kourkoutis, Lena. Tracking motion of topological defects in a stripe charge-ordered phase with continuously variable temperature cryo-STEM. Microscopy and Microanalysis, 27 (S1). Retrieved from https://par.nsf.gov/biblio/10325670. https://doi.org/10.1017/S143192762100355X

Schnitzer, Noah, Goodge, Berit, Bianco, Elisabeth, Admasu, Alemayehu, Kim, Jaewook, Cheong, Sang-Wook, Baggari, Ismail El, and Kourkoutis, Lena. "Tracking motion of topological defects in a stripe charge-ordered phase with continuously variable temperature cryo-STEM". Microscopy and Microanalysis 27 (S1). Country unknown/Code not available. https://doi.org/10.1017/S143192762100355X. https://par.nsf.gov/biblio/10325670.

@article{osti_10325670,
place = {Country unknown/Code not available}, title = {Tracking motion of topological defects in a stripe charge-ordered phase with continuously variable temperature cryo-STEM}, url = {https://par.nsf.gov/biblio/10325670}, DOI = {10.1017/S143192762100355X}, abstractNote = {}, journal = {Microscopy and Microanalysis}, volume = {27}, number = {S1}, author = {Schnitzer, Noah and Goodge, Berit and Bianco, Elisabeth and Admasu, Alemayehu and Kim, Jaewook and Cheong, Sang-Wook and Baggari, Ismail El and Kourkoutis, Lena}, }