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1. Bounded Abstract Effects

   https://doi.org/10.1145/3492427  

   Melicher, Darya ; Xu, Anlun ; Zhao, Valerie ; Potanin, Alex ; Aldrich, Jonathan ( March 2022 , ACM Transactions on Programming Languages and Systems)

   Effect systems have been a subject of active research for nearly four decades, with the most notable practical example being checked exceptions in programming languages such as Java. While many exception systems support abstraction, aggregation, and hierarchy (e.g., via class declaration and subclassing mechanisms), it is rare to see such expressive power in more generic effect systems. We designed an effect system around the idea of protecting system resources and incorporated our effect system into the Wyvern programming language. Similar to type members, a Wyvern object can have effect members that can abstract lower-level effects, allow for aggregation, and have both lower and upper bounds, providing for a granular effect hierarchy. We argue that Wyvern’s effects capture the right balance of expressiveness and power from the programming language design perspective. We present a full formalization of our effect-system design, showing that it allows reasoning about authority and attenuation. Our approach is evaluated through a security-related case study. 

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2. Consumption Network Effects

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   De Giorgi, Giacomo ; Frederiksen, Anders ; Pistaferri, Luigi ( May 2019 , The Review of Economic Studies)
3. Nonparametric estimation of marginal effects in regression-spline random effects models

   https://doi.org/10.1080/07474938.2020.1772569  

   Ma, Shujie ; Racine, Jeffrey S. ; Ullah, Aman ( September 2020 , Econometric Reviews)
4. Localized Stress Effects on the Single Event Effects Sensitivity of Microelectronics

   https://doi.org/10.1149/2162-8777/ad522a  

   Stepanoff, Sergei_P ; Khachatrian, Ani ; Haque, Aman ; Ren, Fan ; Pearton, Stephen ; Wolfe, Douglas_E ( June 2024 , ECS Journal of Solid State Science and Technology)

   Understanding the single event effects (SEE) sensitivity of microelectronic devices and circuits is essential for long-term mission success in ionizing radiation environments. SEEs occur when a single ionizing particle strikes a device with enough energy to cause anomalous malfunction or even a catastrophic failure event. It is conventionally viewed as an electrical phenomenon, whereas this study investigates the possible role of multi-physics. Specifically, we show that localized mechanical stress in electronic devices significantly impacts the degree of SEE sensitivity. We present a technique that indirectly maps both electrical and mechanical field localization to spatially map SEE sensitivity without any need for radiation test sources. It is demonstrated on the operational amplifier LM124 under both pristine and stressed conditions. To validate our hypothesis, our experimental results are compared with those obtained from the well-established pulsed laser SEE technique. Excellent agreement between these results supports our hypothesis that SEE susceptibility may have fundamental roots in both electrical and mechanical fields. Therefore, the ability to map the localizations in these fields may indirectly map the SEE sensitivity of large area electronics, which is very expensive in time and resources.

    

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5. Language effects on bargaining

   https://doi.org/10.1371/journal.pone.0229501  

   Weir, Michael J. ; Ashcraft, Catherine M. ; Leuchanka Diessner, Natallia ; McGreavy, Bridie ; Vogler, Emily ; Guilfoos, Todd ; Miettinen, Topi ( March 2020 , PLOS ONE)