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  • NSF Public Access
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  • Machine Learning Assisted Counterfeit IC Detection through Non-destructive Infrared (IR) Spectroscopy Material Characterization
Title: Machine Learning Assisted Counterfeit IC Detection through Non-destructive Infrared (IR) Spectroscopy Material Characterization
Award ID(s):
1821780
PAR ID:
10356269
Author(s) / Creator(s):
; ; ; ; ;
Date Published:
Journal Name:
ECTC
Page Range / eLocation ID:
2249 to 2255
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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