Predicting Failures in Embedded Systems Using Long Short-Term Inference
- Award ID(s):
- 1704859
- NSF-PAR ID:
- 10359392
- Date Published:
- Journal Name:
- IEEE Embedded Systems Letters
- Volume:
- 13
- Issue:
- 3
- ISSN:
- 1943-0663
- Page Range / eLocation ID:
- 85 to 89
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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Accepted Manuscript1.0
- Journal Article:
- https://doi.org/10.1109/LES.2020.3007361
