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A polymer-based, one-dimensional photonic crystal exhibiting anisotropic responses was demonstrated in the terahertz frequency range. The photonic crystal was composed of alternating compact and low-density polymethacrylate layers. The low-density layers consisted of sub-wavelength sized columns, which were slanted 45° with respect to the substrate surface normal to achieve form-birefringence. Normal incidence polarized terahertz transmission measurements were carried out for characterization of the fabricated photonic crystals in the range from 82 to 125 GHz. The experimental data revealed a 2 GHz shift in the center frequency of the photonic bandgap as a function of in-plane orientation, well demonstrating the anisotropic behavior of the fabricated crystal. The transmission data were analyzed using stratified optical layer model calculations. A good agreement was found between the relevant model parameters and the corresponding design parameters.
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On the terahertz response of metal-gratings on anisotropic dielectric substrates and its prospective application for anisotropic refractive index characterization
This paper discusses the terahertz electromagnetic response of metallic gratings on anisotropic dielectric substrates. The metallic gratings consist of parallel gold stripes. Utilizing numerical simulations, we observe that it is possible to excite a series of resonant modes in these structures. These modes are affected differently by the different indices on the anisotropic substrate. An analytical model is discussed to show that modes associated with transmission peaks are due to the excitation of (a) Fabry–Pérot modes with polarization along the grating and/or (b) waveguide modes with polarization perpendicular to the grating. It is observed that the resonance associated with the TM1,1mode is a narrow linewidth resonance which, in some particular circumstances, becomes nearly independent of substrate thickness. Therefore, from the spectral position of this resonance, it is possible to extract the out-of-plane component of the substrate refractive index with very small uncertainty. Based on this observation, we demonstrate the refractive index characterization of several lossless semiconductor substrates through frequency-domain polarized terahertz transmission measurements in the frequency range of 0.2–0.6 THz at normal incidence. The reliability of the technique is demonstrated on well-known materials, such as high-resistivity silicon and sapphire substrates. This technique is also applied for the characterization of a Fe-doped β-Ga2O3single-crystal substrate.
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- Award ID(s):
- 1936729
- PAR ID:
- 10367243
- Publisher / Repository:
- American Institute of Physics
- Date Published:
- Journal Name:
- Journal of Applied Physics
- Volume:
- 131
- Issue:
- 19
- ISSN:
- 0021-8979
- Page Range / eLocation ID:
- Article No. 193101
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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