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Decades of measurements of the thermophysical properties of hot metals show that pulsed Joule heating is an effective method to heat solid and liquid metals that are chemically reactive or difficult to contain. To extend such measurements to hundreds of GPa pressure, pulsed heating methods have recently been integrated with diamond anvil cells. The recent design used a low-side switch and active electrical sensing equipment that was prone to damage and measurement error. Here, we report the design and characterization of new electronics that use a high-side switch and robust, passive electrical sensing equipment. The new pulse amplifier can heat ∼5 to 50 μm diameter metal wires to thousands of kelvin at tens to hundreds of GPa using diamond anvil cells. Pulse durations and peak currents can each be varied over three orders of magnitude, from 5 µs to 10 ms and from 0.2 to 200 A. The pulse amplifier is integrated with a current probe. Two voltage probes attached to the body of a diamond anvil cell are used to measure voltage in a four-point probe geometry. The accuracy of four-point probe resistance measurements for a dummy sample with 0.1 Ω resistance is typically better than 5% at all times from 2 µs to 10 ms after the beginning of the pulse.
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Are Liquid Metals Bulk Conductors?
Abstract Stretchable electronics have potential in wide‐reaching applications including wearables, personal health monitoring, and soft robotics. Many recent advances in stretchable electronics leverage liquid metals, particularly eutectic gallium‐indium (EGaIn). A variety of EGaIn electromechanical behaviors have been reported, ranging from bulk conductor responses to effectively strain‐insensitive responses. However, numerous measurement techniques have been used throughout the literature, making it difficult to directly compare the various proposed formulations. Here, the electromechanical responses of EGaIn found in the literature is reviewed and pure EGaIn is investigated using three electrical resistance measurement techniques: four point probe, two point probe, and Wheatstone bridge. The results indicate substantial differences in measured electromechanical behavior between the three methods, which can largely be accounted for by correcting for a fixed offset corresponding to the resistances of various parts of the measurement circuits. Yet, even accounting for several of these sources of experimental error, the average relative change in resistance of EGaIn is found to be lower than that predicted by the commonly used bulk conductor assumption, referred to as Pouillet's law. Building upon recent theories proposed in the literature, possible explanations for the discrepancies are discussed. Finally, suggestions are provided on experimental design to enable reproducible and interpretable research.
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- Award ID(s):
- 1954591
- PAR ID:
- 10375150
- Publisher / Repository:
- Wiley Blackwell (John Wiley & Sons)
- Date Published:
- Journal Name:
- Advanced Materials
- Volume:
- 34
- Issue:
- 26
- ISSN:
- 0935-9648
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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