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Title: Robustness of Passivated ALD Zinc Tin Oxide TFTs to Aging and Bias Stress
Award ID(s):
1727918
NSF-PAR ID:
10387205
Author(s) / Creator(s):
; ; ;
Date Published:
Journal Name:
IEEE Transactions on Electron Devices
Volume:
69
Issue:
12
ISSN:
0018-9383
Page Range / eLocation ID:
6776 to 6782
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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