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Title: Dynamic Gate Breakdown of p-Gate GaN HEMTs in Inductive Power Switching
Award ID(s):
2036740 2045001
NSF-PAR ID:
10396737
Author(s) / Creator(s):
; ; ; ; ; ; ;
Date Published:
Journal Name:
IEEE Electron Device Letters
Volume:
44
Issue:
2
ISSN:
0741-3106
Page Range / eLocation ID:
217 to 220
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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