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This content will become publicly available on May 28, 2024

Title: Gate Lifetime of P-Gate GaN HEMT in Inductive Power Switching
Award ID(s):
2045001 2036740
NSF-PAR ID:
10487993
Author(s) / Creator(s):
; ; ; ; ; ; ;
Publisher / Repository:
IEEE
Date Published:
Journal Name:
2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD)
Page Range / eLocation ID:
20 to 23
Format(s):
Medium: X
Location:
Hong Kong
Sponsoring Org:
National Science Foundation
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