Stuck-at-Fault Immunity Enhancement of Memristor-Based Edge AI Systems
- PAR ID:
- 10397915
- Date Published:
- Journal Name:
- IEEE Journal on Emerging and Selected Topics in Circuits and Systems
- Volume:
- 12
- Issue:
- 4
- ISSN:
- 2156-3357
- Page Range / eLocation ID:
- 922 to 933
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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