Pei, Kexin, She, Dongdong, Wang, Michael, Geng, Scott, Xuan, Zhou, David, Yaniv, Yang, Junfeng, Jana, Suman, and Ray, Baishakhi. NeuDep: neural binary memory dependence analysis. Retrieved from https://par.nsf.gov/biblio/10397925. ESEC/FSE 2022: Proceedings of the 30th ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering . Web. doi:10.1145/3540250.3549147.

Pei, Kexin, She, Dongdong, Wang, Michael, Geng, Scott, Xuan, Zhou, David, Yaniv, Yang, Junfeng, Jana, Suman, & Ray, Baishakhi. NeuDep: neural binary memory dependence analysis. ESEC/FSE 2022: Proceedings of the 30th ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering, (). Retrieved from https://par.nsf.gov/biblio/10397925. https://doi.org/10.1145/3540250.3549147

Pei, Kexin, She, Dongdong, Wang, Michael, Geng, Scott, Xuan, Zhou, David, Yaniv, Yang, Junfeng, Jana, Suman, and Ray, Baishakhi. "NeuDep: neural binary memory dependence analysis". ESEC/FSE 2022: Proceedings of the 30th ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering (). Country unknown/Code not available. https://doi.org/10.1145/3540250.3549147. https://par.nsf.gov/biblio/10397925.

@article{osti_10397925,
place = {Country unknown/Code not available}, title = {NeuDep: neural binary memory dependence analysis}, url = {https://par.nsf.gov/biblio/10397925}, DOI = {10.1145/3540250.3549147}, abstractNote = {}, journal = {ESEC/FSE 2022: Proceedings of the 30th ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering}, author = {Pei, Kexin and She, Dongdong and Wang, Michael and Geng, Scott and Xuan, Zhou and David, Yaniv and Yang, Junfeng and Jana, Suman and Ray, Baishakhi}, }