Page, Andrew, and Chen, Xu. Efficient Uncertainty Quantification of Stripline Pulse Response using Singular Value Decomposition and Delay Extraction. Retrieved from https://par.nsf.gov/biblio/10402076. 2022 IEEE 31st Conference on Electrical Performance of Electronic Packaging and Systens (EPEPS) . Web. doi:10.1109/APEMC53576.2022.9888395.
Page, Andrew, & Chen, Xu. Efficient Uncertainty Quantification of Stripline Pulse Response using Singular Value Decomposition and Delay Extraction. 2022 IEEE 31st Conference on Electrical Performance of Electronic Packaging and Systens (EPEPS), (). Retrieved from https://par.nsf.gov/biblio/10402076. https://doi.org/10.1109/APEMC53576.2022.9888395
Page, Andrew, and Chen, Xu.
"Efficient Uncertainty Quantification of Stripline Pulse Response using Singular Value Decomposition and Delay Extraction". 2022 IEEE 31st Conference on Electrical Performance of Electronic Packaging and Systens (EPEPS) (). Country unknown/Code not available. https://doi.org/10.1109/APEMC53576.2022.9888395.https://par.nsf.gov/biblio/10402076.
@article{osti_10402076,
place = {Country unknown/Code not available},
title = {Efficient Uncertainty Quantification of Stripline Pulse Response using Singular Value Decomposition and Delay Extraction},
url = {https://par.nsf.gov/biblio/10402076},
DOI = {10.1109/APEMC53576.2022.9888395},
abstractNote = {},
journal = {2022 IEEE 31st Conference on Electrical Performance of Electronic Packaging and Systens (EPEPS)},
author = {Page, Andrew and Chen, Xu},
}