Summary form only given. We are developing a scanning tunneling microscope that is portable and optimized for scanning frequency comb microscopy (SFCM) as one part of our effort to complete a prototype for the carrier profiling of semiconductors by SFCM. Conventional integral or integral plus proportion feedback control of the tunneling current in a scanning tunneling microscope (STM) is satisfactory once tunneling has been established but may cause tip-crash by integral windup during coarse approach. In tip-sample contact images with atomic-resolution may be obtained but the microwave frequency comb ceases because there is no optical rectification and scanning tunneling spectroscopy also fails. We are studying a new control algorithm based on approximating the tunneling current as a polynomial in the bias voltage where the coefficients in this polynomial are not required. It is noted that hanges in the apparatus, as well as the algorithms used for feedback control in the STM, are required to optimize this instrument for measuring the microwave frequency comb.
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Characterizations of two-dimensional materials with cryogenic ultrahigh vacuum near-field optical microscopy in the visible range
The development of new characterization methods has resulted in innovative studies of the properties of two-dimensional (2D) materials. Observations of nanoscale heterogeneity with scanning probe microscopy methods have led to efforts to further understand these systems and observe new local phenomena by coupling light-based measurement methods into the tip-sample junction. Bringing optical spectroscopy into the near-field in ultrahigh vacuum at cryogenic temperatures has led to highly unique studies of molecules and materials, yielding new insight into otherwise unobservable properties nearing the atomic scale. Here, we discuss studies of 2D materials at the subnanoscale where the measurement method relies on the detection of visible light scattered or emitted from the scanning tunneling microscope (STM). We focus on tip-enhanced Raman spectroscopy, a subset of scattering-type scanning near-field optical microscopy, where incident light is confined and enhanced by a plasmonic STM tip. We also mention scanning tunneling microscope induced luminescence, where the STM tip is used as a highly local light source. The measurement of light-matter interactions within the atomic STM cavity is expected to continue to provide a useful platform to study new materials.
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- Award ID(s):
- 1944796
- NSF-PAR ID:
- 10402599
- Date Published:
- Journal Name:
- Journal of Vacuum Science & Technology A
- Volume:
- 40
- Issue:
- 4
- ISSN:
- 0734-2101
- Page Range / eLocation ID:
- 040801
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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- Free Publicly Accessible Full Text
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Accepted Manuscript1.0
- Journal Article:
- https://doi.org/10.1116/6.0001853
