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Title: High-Force Application by a Nanoscale DNA Force Spectrometer
Award ID(s):
1715321
PAR ID:
10405659
Author(s) / Creator(s):
; ; ; ; ;  ;  ; ; ;
Publisher / Repository:
American Chemical Society
Date Published:
Journal Name:
ACS Nano
Volume:
16
Issue:
4
ISSN:
1936-0851
Page Range / eLocation ID:
p. 5682-5695
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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    Correlative scanning probe microscopy of chemical identity, surface potential, and mechanical properties provide insight into the structure–function relationships of nanomaterials. However, simultaneous measurement with comparable and high resolution is a challenge. We seamlessly integrated nanoscale photothermal infrared imaging with Coulomb force detection to form peak force infrared–Kelvin probe force microscopy (PFIR‐KPFM), which enables simultaneous nanomapping of infrared absorption, surface potential, and mechanical properties with approximately 10 nm spatial resolution in a single‐pass scan. MAPbBr3perovskite crystals of different degradation pathways were studied in situ. Nanoscale charge accumulations were observed in MAPbBr3near the boundary to PbBr2. PFIR‐KPFM also revealed correlations between residual charges and secondary conformation in amyloid fibrils. PFIR‐KPFM is applicable to other heterogeneous materials at the nanoscale for correlative multimodal characterizations.

     
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