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Peak force infrared (PFIR) microscopy is an emerging atomic force microscopy (AFM)-based infrared microscopy that bypasses Abbe's diffraction limit on spatial resolution. The PFIR microscopy utilizes a nanoscopically sharp AFM tip to mechanically detect the tip-enhanced infrared photothermal response of the sample in the time domain. The time-gated mechanical signals of cantilever deflections transduce the infrared absorption of the sample, delivering infrared imaging and spectroscopy capability at sub 10 nm spatial resolution. Both the infrared absorption response and mechanical properties of the sample are obtained in parallel while preserving the surface integrity of the sample. This review describes the constructions of the PFIR microscope and several variations, including multiple-pulse excitation, total internal reflection geometry, dual-color configuration, liquid-phase operations, and integrations with simultaneous surface potential measurement. Representative applications of PFIR microscopy are also included in this review. In the outlook section, we lay out several future directions of innovations in PFIR microscopy and applications in chemical and material research.
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Peak Force Infrared–Kelvin Probe Force Microscopy
Abstract Correlative scanning probe microscopy of chemical identity, surface potential, and mechanical properties provide insight into the structure–function relationships of nanomaterials. However, simultaneous measurement with comparable and high resolution is a challenge. We seamlessly integrated nanoscale photothermal infrared imaging with Coulomb force detection to form peak force infrared–Kelvin probe force microscopy (PFIR‐KPFM), which enables simultaneous nanomapping of infrared absorption, surface potential, and mechanical properties with approximately 10 nm spatial resolution in a single‐pass scan. MAPbBr3perovskite crystals of different degradation pathways were studied in situ. Nanoscale charge accumulations were observed in MAPbBr3near the boundary to PbBr2. PFIR‐KPFM also revealed correlations between residual charges and secondary conformation in amyloid fibrils. PFIR‐KPFM is applicable to other heterogeneous materials at the nanoscale for correlative multimodal characterizations.
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- Award ID(s):
- 1847765
- PAR ID:
- 10164764
- Publisher / Repository:
- Wiley Blackwell (John Wiley & Sons)
- Date Published:
- Journal Name:
- Angewandte Chemie International Edition
- Volume:
- 59
- Issue:
- 37
- ISSN:
- 1433-7851
- Page Range / eLocation ID:
- p. 16083-16090
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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