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Title: Probing electronic dead layers in homoepitaxial n -SrTiO 3 (001) films
We combine state-of-the-art oxide epitaxial growth by hybrid molecular beam epitaxy with transport, x-ray photoemission, and surface diffraction, along with classical and first-principles quantum mechanical modeling to investigate the nuances of insulating layer formation in otherwise high-mobility homoepitaxial n-SrTiO 3 (001) films. Our analysis points to charge immobilization at the buried n-SrTiO 3 /undoped SrTiO 3 (001) interface as well as within the surface contamination layer resulting from air exposure as the drivers of electronic dead-layer formation. As Fermi level equilibration occurs at the surface and the buried interface, charge trapping reduces the sheet carrier density ( n 2 D ) and renders the n-STO film insulating if n 2 D falls below the critical value for the metal-to-insulator transition.  more » « less
Award ID(s):
2011401
NSF-PAR ID:
10411282
Author(s) / Creator(s):
; ; ; ; ; ; ; ; ; ; ;
Date Published:
Journal Name:
APL Materials
Volume:
10
Issue:
7
ISSN:
2166-532X
Page Range / eLocation ID:
070903
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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