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Nernst coefficient measurements are a classic approach to investigate charge carrier scattering in both metals and semiconductors. However, such measurements are not commonly performed, despite the potential to inform material design strategies in applications such as thermoelectricity. As dedicated instruments are extremely scarce, we present here a room temperature apparatus to measure the low field Nernst coefficient (and magneto-Seebeck coefficient) in bulk polycrystalline samples. This apparatus is specifically designed to promote accurate and facile use, with the expectation that such an instrument will make Nernst measurements de rigueur. In this apparatus, sample loading and electrical contacts are all pressure-based and alignment is automatic. Extremely stable thermal control (10 mK of fluctuation when ΔT = 1 K) is achieved from actively cooled thermoelectric modules that operate as heaters or Peltier coolers. Magneto-Seebeck measurements are integrated into the system to correct for residual probe offsets. Data from the apparatus are provided on bulk polycrystalline samples of bismuth, InSb, and SnTe, including raw data to illustrate the process of calculating the Nernst coefficient. Finally, we review how Nernst measurements, in concert with Seebeck, Hall, and electrical resistivity, can be analyzed via the Boltzmann equation in the relaxation time approximation to self-consistently predict the Fermi level, effective mass, and energy-dependent relaxation time.
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Nernst coefficient measurements in two-dimensional materials
Abstract The discovery of two-dimensional (2D) ferromagnets and antiferromagnets with topologically nontrivial electronic band structures makes the study of the Nernst effect in 2D materials of great importance and interest. To measure the Nernst coefficient of 2D materials, the detection of the temperature gradient is crucial. Although the micro-fabricated metal wires provide a simple but accurate way for temperature detection, a linear-response assumption that the temperature gradient is a constant is still necessary and has been widely used to evaluate the temperature gradient. However, with the existence of substrates, this assumption cannot be precise. In this study, we clearly show that the temperature gradient strongly depends on the distance from the heater by both thermoelectric transport and thermoreflectance measurements. Fortunately, both measurements show that the temperature gradient can be well described by a linear function of the distance from the heater. This linearity is further confirmed by comparing the measured Nernst coefficient to the value calculated from the generalized Mott’s formula. Our results demonstrate a precise way to measure the Nernst coefficient of 2D materials and would be helpful for future studies.
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- Award ID(s):
- 1653268
- PAR ID:
- 10415148
- Date Published:
- Journal Name:
- Journal of Physics D: Applied Physics
- Volume:
- 55
- Issue:
- 45
- ISSN:
- 0022-3727
- Page Range / eLocation ID:
- 455303
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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- Free Publicly Accessible Full Text
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Accepted Manuscript
- Journal Article:
- https://doi.org/10.1088/1361-6463/ac923f
