Abstract After graphene was first exfoliated in 2004, research worldwide has focused on discovering and exploiting its distinctive electronic, mechanical, and structural properties. Application of the efficacious methodology used to fabricate graphene, mechanical exfoliation followed by optical microscopy inspection, to other analogous bulk materials has resulted in many more two-dimensional (2D) atomic crystals. Despite their fascinating physical properties, manual identification of 2D atomic crystals has the clear drawback of low-throughput and hence is impractical for any scale-up applications of 2D samples. To combat this, recent integration of high-performance machine-learning techniques, usually deep learning algorithms because of their impressive object recognition abilities, with optical microscopy have been used to accelerate and automate this traditional flake identification process. However, deep learning methods require immense datasets and rely on uninterpretable and complicated algorithms for predictions. Conversely, tree-based machine-learning algorithms represent highly transparent and accessible models. We investigate these tree-based algorithms, with features that mimic color contrast, for automating the manual inspection process of exfoliated 2D materials (e.g., MoSe2). We examine their performance in comparison to ResNet, a famous Convolutional Neural Network (CNN), in terms of accuracy and the physical nature of their decision-making process. We find that the decision trees, gradient boosted decision trees, and random forests utilize physical aspects of the images to successfully identify 2D atomic crystals without suffering from extreme overfitting and high training dataset demands. We also employ a post-hoc study that identifies the sub-regions CNNs rely on for classification and find that they regularly utilize physically insignificant image attributes when correctly identifying thin materials.
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Measuring complex refractive index through deep-learning-enabled optical reflectometry
Abstract Optical spectroscopy is indispensable for research and development in nanoscience and nanotechnology, microelectronics, energy, and advanced manufacturing. Advanced optical spectroscopy tools often require both specifically designed high-end instrumentation and intricate data analysis techniques. Beyond the common analytical tools, deep learning methods are well suited for interpreting high-dimensional and complicated spectroscopy data. They offer great opportunities to extract subtle and deep information about optical properties of materials with simpler optical setups, which would otherwise require sophisticated instrumentation. In this work, we propose a computational approach based on a conventional tabletop optical microscope and a deep learning model called ReflectoNet . Without any prior knowledge about the multilayer substrates, ReflectoNet can predict the complex refractive indices of thin films and 2D materials on top of these nontrivial substrates from experimentally measured optical reflectance spectra with high accuracies. This task was not feasible previously with traditional reflectometry or ellipsometry methods. Fundamental physical principles, such as the Kramers–Kronig relations, are spontaneously learned by the model without any further training. This approach enables in-operando optical characterization of functional materials and 2D materials within complex photonic structures or optoelectronic devices.
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- PAR ID:
- 10416124
- Date Published:
- Journal Name:
- 2D Materials
- Volume:
- 10
- Issue:
- 2
- ISSN:
- 2053-1583
- Page Range / eLocation ID:
- 025025
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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